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MAPP has been awarded a £200,000 Impact, Innovation and Knowledge Exchange (IIKE) Flagship Award from the University of Sheffield.
The award draws on funding from the University’s EPSRC Impact Acceleration Account (IAA) and Higher Education Innovation Fund (HEIF) and is matched with over £300,000 of funding from other sources.
The MIAMI project is focused on improving the productivity of additive manufacturing (AM) via improved monitoring and control to achieve 'right first time' manufacturing and novel approaches to improving the speed of AM.
MIAMI brings in new academic investigators at Sheffield to the MAPP Hub and builds links with new commercial and academic partners including the Future Metrology Hub at Huddersfield.
MIAMI will accelerate the development and translation of new technologies including thermal metrology systems being developed by Dr Jon Willmott, an EPSRC Manufacturing Fellow in the Department of Electronic and Electrical Engineering, and the Diode Area Melting (DAM) system being developed by Dr Kamran Mumtaz in the Department of Mechanical Engineering and Dr Kris Groom from Department of Electronic and Electrical Engineering.
Richard France, MAPP’s Senior Business Development Manager said: "The MIAMI award has allowed us to expand the MAPP team at Sheffield and draw in some exciting new technology developments. It will also help us build collaborations with new industry partners and develop an important research link with the Future Metrology Hub at the University of Huddersfield."
MIAMI will run between July 2017 and March 2020.
Richard Leach, Professor of Metrology at the University of Nottingham - 'Enriching additive manufacturing metrology.'
"Deepening our understanding of the research activities across the MAPP sites."
A great case study has been published about one of our aligned projects Horizon (AM).